Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Blog Article

Abstract Real-space, three-dimensional imaging of atomic structures in materials science is a critical yet challenging task.Although scanning transmission electron microscopy has achieved sub-angstrom lateral resolution through techniques like electron ptychography, depth resolution remains limited to only 2 to 3 nanometers using single-projection setups.Attaining better depth resolution often requires large sample tilt angles and numerous projections, as demonstrated in atomic electron tomography.Here, we introduce a&d ej-123 an extension of multislice electron ptychography, which couples only a few small-angle projections to improve depth resolution by nightstick twm-850xl more than threefold, reaching the sub-nanometer scale and potentially approaching the atomic level.

This technique maintains high resolving power for both light and heavy atoms, significantly enhancing the detection of individual dopants.We experimentally demonstrate three-dimensional visualization of dilute praseodymium dopants in a brownmillerite oxide, Ca2Co2O5, along with the accompanying lattice distortions.This approach can be implemented on widely available transmission electron microscopes equipped with hybrid pixel detectors, with data processing achievable using high-performance computing systems.